Repository logo

Browsing by Author "Szyper, Michał"

Filter results by typing the first few letters
Now showing 1 - 14 of 14
  • thumbnail.journal.alt
    Item type:Doctoral Dissertation, Access status: Open Access ,
    Badania modelowe właściwości metrologicznych układu do pomiaru stężenia tlenu w gazie wydechowym z zastosowaniem czujnika elektrochemicznego
    (Data obrony: 2009-07-02) Przybyło, Tadeusz
    Wydział Elektrotechniki, Automatyki, Informatyki i Elektroniki
    The thesis relates to research on the dynamic properties of the correction of electrochemical oxygen concentration sensor, in application for measuring oxygen concentration for measuring oxygen concentration wave in breath. At the moment this type of sensors are often used in the medical apparatus. They have multipe and nonlinear dynamics, therefore it is necessary to construct measuring apparatus with systems that correct dynamic error. The thesis shows that choice of the appropriate sensor model, which takes into account its dynamic properties, allows effective correction of the dynamic error of the sensor and analyzer, where the sensor was used. In the case of that thesis, it was built a model of oxygen concentration analyzer consists of model of pneumatic system, which absorbs gas samples and the model of sensor. In the system it was examined two ways of modeling: physical, covering all the physical phenomena in the sensor, and formal, that shows the nature of complex dynamics of the sensor. Parameters of the models were identified based on the results of the measurements recorded in the real system. Physical model of the sensor proved to be difficult to apply in the corrector of the system dynamic properties. Mathematical model of the sensor provides a simplified description of its dynamic properties. Therefore, the nonlinear dynamics of the sensor was modeled with the help of the system of spline differential equation and that model is reversible. Proposed spline model was used in the construction of the corrector of dynamic properties analyzer. Algorithm of the correction was implemented as a corrective procedure in the Matlab program and in microcontroller type SOC. Elaborated way of the correction tested effectiveness of its activity, based on measurements in a real system analyzer.
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Izolowany galwanicznie analogowy układ do pomiaru prądu opis patentowy nr 214364
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2013-07-31) Szyper, Michał; Bień, Andrzej; Wetula, Andrzej; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Izolowany galwanicznie cyfrowy układ do pomiaru prądu opis patentowy nr 214928
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2013-09-30) Szyper, Michał; Wetula, Andrzej; Bień, Andrzej; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Doctoral Dissertation, Access status: Open Access ,
    Metoda bezstykowego wyznaczania rezystancji cienkich warstw przewodzących
    (Data obrony: 2009) Stec, Włodzimierz
    Wydział Elektrotechniki, Automatyki, Informatyki i Elektroniki
    The paper proposes a modification of the method using eddy currents to measure the resistance of thin layers of conductors. The object of research is the coating of glass substrate for use in construction. The proposed method allows performing measurements at selected points in large glass panes without damage layer. Developed test procedures and way how to calculate the impedance of a layer base on resonance curves. In addition, the author has proposed a means to verify the results obtained by means of model tests specifically shaped layers test. An extensive analysis of errors and methods of measurement of uncertainty with regard to the results obtained in the modeling were also carried out, as well as actual measurements. The sensor working in serial resonance provides high sensitivity and an increase in the resistance to interference from external factors, which are extremely important for the use of the equipment in industrial conditions. Designed and manufactured measurement system allows you to move the sensor away from a thin layer to a distance of 5 mm, and in the case of layers with high conductivity up to 20 mm. The obtained results confirmed assumptions of the pre-thesis work and the usefulness of the method developed to measure the resistance of thin layers derived from ion technologies.
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Optyczny transmiter energii elektrycznej opis patentowy nr 214820
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2013-09-30) Szyper, Michał; Bień, Andrzej; Wojnar, Edward; Wetula, Andrzej; Boroń, Artur; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Optyczny transmiter energii elektrycznej opis patentowy nr 216785
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2014-05-30) Wojnar, Edward; Szyper, Michał; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Separator galwaniczny sygnałów analogowych dolnopasmowych opis patentowy nr 158919
    (Urząd Patentowy Rzeczypospolitej Polskiej, 1992-10-30) Szyper, Michał; Żegleń, Tadeusz; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Separator galwaniczny sygnałów analogowych dolnopasmowych opis patentowy nr 161592
    (Urząd Patentowy Rzeczypospolitej Polskiej, 1993-07-30) Szyper, Michał; Żegleń, Tadeusz; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Sposób pomiaru rezystancji doziemnej w izolowanym torze prądu stałego opis patentowy nr 158413
    (Urząd Patentowy Rzeczypospolitej Polskiej, 1992-08-31) Szyper, Michał; Gajda, Janusz; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Sposób transferu sygnałów analogowych przez barierę pojemnościową i układ elektroniczny przeznaczony do transferu sygnałów analogowych przez barierę pojemnościową opis patentowy nr 216657
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2014-04-30) Szyper, Michał; Żegleń, Tadeusz; Boroń, Artur; Gryboś, Paweł; Szczygieł, Robert; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Światłowodowy kabel optoelektroniczny opis patentowy nr 215847
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2014-02-28) Szyper, Michał; Bień, Andrzej; Wojnar, Edward; Wetula, Andrzej; Boroń, Artur; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Układ elektryczny zwiększający odporność izolatorów galwanicznych na wysokonapięciowe zakłócenia wspólne opis patentowy nr 214938
    (Urząd Patentowy Rzeczypospolitej Polskiej, 2013-09-30) Szyper, Michał; Żegleń, Tadeusz; Boroń, Artur; Gryboś, Paweł; Szczygieł, Robert; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Patent, Access status: Open Access ,
    Układ napędowy pisaka rejestratora analogowego opis patentowy nr 134843
    (Urząd Patentowy PRL, 1987-02-28) Szyper, Michał; Witek, Zbigniew Kazimierz; Akademia Górniczo-Hutnicza im. Stanisława Staszica (Kraków)
  • thumbnail.journal.alt
    Item type:Doctoral Dissertation, Access status: Open Access ,
    Zastosowanie sieci neuronowych do rozpoznawania zaburzeń elektromagnetycznych i pomiaru ich ilościowych wskaźników
    (Data obrony: 2009) Szlosek, Marcin
    Wydział Elektrotechniki, Automatyki, Informatyki i Elektroniki
    Many flickermeters do not yield credible output readings although the manufacturers declare their compliance with the requirements of standard IEC 61000-4-15. Even the instruments from the same manufacturer may differ substantially in their results. There are many proofs that provisions of this standard are not sufficiently precise. Some inexact formulations, like those regarding the definition of a modulating waveform - the depth of modulation and frequency of the modulating signal - have been rectified in the recently published annex to the standard document. Moreover, the standard has been prepared for flickermeters of analogue design, while most of currently available instruments are based on digital techniques. Modifications or revisions to the standard and increasing the number of requirements, what is currently taking place, seem to be interim actions, whose results are dubious. On the other hand, it should be acknowledged that since over ten years the standardization of voltage fluctuations is based on the UIE flickermeter. Thus no radical changes, like totally different method for assessment of the considered disturbance, should be introduced. The authors' idea is to treat a flickermeter - from its analogue input to the output of block 4 - as a black box, filled in by a designer accordingly to its decision, while maintaining the IN/OUT characteristics in conformity with those of the flickermeter regarded as a standard one. For this purpose a model of flickermeter was developed in MATLAB environment. In the authors' intention it will be employed as a source of standard signals, used in further investigation.