Finite element analysis of bipolar plate stamping based on a Yld2000 yield model

Abstract

Finite element analysis is an essential means for bipolar plate design and the optimization of the manufacturing process. However, the accuracy of the finite element simulation is significantly affected by the constitutive model, especially the yield model. In this paper, uniaxial and biaxial tensile tests were conducted to obtain the yield loci of an ultra-thin austenite stainless steel. The Yld2000 yield model was calibrated using the yield loci under different equivalent plastic strains. The microchannel stamping experiment and its finite element simulations were conducted to study the effect of yield model parameters on the finite element simulation of bipolar plate stamping. The results show that the simulation with Yld2000 calibrated by 0.004 and 0.05 equivalent plastic strain has the best prediction accuracy for the microchannel springback and thickness distribution, respectively.